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Seiko Instruments Inc.
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HOME > Reliability Test Results

Reliability Test Results

Power Supply ICs

  • Voltage Detectors
  • Voltage Regulators
  • Switching Regulators
  • Charge Pump ICs
  • Composite ICs
  • Lithium-ion Battery Protection ICs

Memory

  • 3-Wire Serial EEPROMs
  • 2-Wire Serial EEPROMs
  • SPI-Bus Serial EEPROM

Sensors / Analog ICs

  • Temperature Sensor ICs
  • Magnetism Sensor ICs
  • Operational Amplifiers
  • Comparators

Real-time Clock etc.

  • Real-Time Clock
  • Programable Port Controller
  • Mini Logic
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